TOLL package high-current chip test socket 

The TOLL package high-current chip test socket is specifically designed for rail MOSFETs, featuring a high-current Kelvin open-short test.

This test socket is capable of conducting transient tests at 40V and 300A, suitable not only for aging tests but also for open-short testing and transient current limit testing of the chips. In modern electronic devices, rail MOSFETs play a crucial role in controlling current and voltage.

To ensure the reliability and stability of rail MOSFETs, comprehensive testing is essential. The introduction of the TOLL package high-current chip test socket provides a new solution for testing rail MOSFETs.

Firstly, the test socket features a high-current Kelvin open-short test, accurately measuring the contact resistance and short-circuit conditions of the chips to ensure their normal operation. Through Kelvin connection technology, the test socket can eliminate the influence of test line resistance on the test results, enhancing the accuracy and reliability of the testing.

Secondly, the test socket supports transient testing at 40V and 300A, simulating the working environment of the chips under high voltage and high current conditions to evaluate their performance under extreme conditions. This is crucial for the reliability testing of high-current chips such as rail MOSFETs, helping manufacturers and engineers to fully understand the chips’ extreme operating conditions for more precise design and selection.

Additionally, the test socket also features aging testing, simulating the performance changes of the chips after long-term operation to evaluate their stability and reliability in practical use. Through aging testing, it is possible to better predict the lifespan and performance degradation of the chips, providing important references for product reliability.

In conclusion, the TOLL package high-current chip test socket provides a comprehensive and reliable solution for testing high-current chips such as rail MOSFETs. Its high-current Kelvin open-short test, 40V, 300A transient test, and aging test functions will offer electronic device manufacturers and engineers more precise and reliable testing methods, helping to ensure the quality and reliability of products and driving the development and progress of the industry.