分类： Uncategorized
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What is the different in NFC Core Chip Test Socket, Programming Socket, and Functional Aging Test Socket?
NFC Core Chip Test Socket, Programming Socket, and Func…
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What is a Terahertz Quantum Energy Chip Aging Socket?
A terahertz quantum energy chip is a semiconductor devi…
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Highly Accelerated Stress Test (HAST) and Its Application in BGA100 Chips
Highly Accelerated Stress Test (HAST) is a method used …
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HTGB +/- Positive For TO220/TO247 type IGTB Burn in Test
HTGB (High-Temperature Gate Bias) testing is a method u…
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UFS FT Burn in Test Socket
UFS (Universal Flash Storage) chips are a high-performa…
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Challenges in Testing HBM DRAM Chips: Small Size, Tight Spacing, and Microscopic Alignment
1.Abstract: HBM DRAM chip testing poses several challen…
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Chip reliability testing with full info
1. The definition of reliability testing mainly include…
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Pogo Pin Structure and related function for IC test
Pogo pins, also known as spring-loaded contacts or spri…
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DFQ SOIC7 temp sensor socket
Temperature sensing plays a crucial role in various ind…
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GDDR7 BGA Package test socket for next GPU IC test and Burn in test
GDDR7 (Graphics Double Data Rate 7) is a high-performan…
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8-bit microcontrollers SOP16-1.27 type IC burn in Socket and programming
In burn-in/aging testing, an SOP16 package chip like th…
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FPGA Computing Power Level And Related Test Socket info
Detailed Description of FPGA Computing Power Level Deta…
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PCB Craft Importance for IC socket Contact and IC test Stability
1. Signal Integrity 2. Mechanical Stability 3. Contact …
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What is a Chip Test Fixture?
A chip test fixture is a device used for testing integr…
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ANDK Wafer Burn in Socket Introduction
With the continuous advancement of the semiconductor in…
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Steps to Program an MSP430 Microcontroller Using the ANDK BGA113 Test Socket and JTAG Interface
1. Prepare Tools 2. Connect Hardware 3. Configure the P…
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Overview of Optical Module Chips and ANDK Test Sockets
I. Overview of Optical Module Chips Optical module chip…
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Detailed Explanation of GDDR7 Memory and GDDR7 Socket
1. Data Transfer Bandwidth: 2. Power Management: 3. Sto…
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IPU Chips and related Package Burn in Socket
IPU (Image Processing Unit) chips are specialized for i…
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Features of FOPLP Packaging and Advantages of ANDK Burn-In Socket
Features of FOPLP Packaging FOPLP (Fan-Out Panel-Level …
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Details of Automotive Semiconductor Device Testing Standards
1. AEC-Q100 The AEC-Q100 standard focuses on evalu…
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MEMS test key point and MEMS test socket
MEMS (Micro-Electro-Mechanical Systems) is an abbreviat…
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QFP64 Chip Test Socket – Precise Testing
In the rapidly developing field of automotive electroni…
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How to order and produce a customized IC fixture for your personal test requirements?
Ordering and producing a customized IC (Integrated Circ…
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How to order and produce a customized socket for your personal test requirements?
Ordering and producing a customized socket for personal…
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Challenges and Importance of Testing SMD5 Series Chip Sockets
In the realm of electronic component testing, the SMD5 …
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TO247 MOSFET Burn in test socket with 10A function inspection
For a TO-247 MOSFET chip test socket, it needs to suppo…
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HDSOP22-1.14 Burn in Socket For AEC-Q101 test
Product Overview: The HDSOP22-1.14 Aging Socket is spec…
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Introduction to CMOS CFET Burn in socket
Basic Structure: Advantages: Basic Function: Logic Gate…
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4-Channel High-Side Driver IC Socket with STi²Fuse Protection
Overview A high-side driver is a type of electronic dev…
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What about DDR4 VS DDR5?
DDR5 is the latest and most advanced memory standard, s…
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Common Types of Test Sockets for Consumer, Industrial, and Automotive Grade Chips
Test sockets are devices used to facilitate easy insert…
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ANDK CCP Socket how to meet RTC IC test?
Ultra-Low Power Medical Real-Time Clock (RTC) is a spec…
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Pioneering E-Paper Display Testing with ANDK’s Pogo Blade Pin Module
Introduction: In the dynamic landscape of electronic di…
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Overclocking Chip Test Socket: The Power Tool for Exploring Performance Limits
Introduction to Overclocking Overclocking, a term well-…
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What’s about ANDK DDR5 high speed test fixture and function test?
When using the ANDK DDR5 memory testing fixture to test…
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AI vision edge computing SOC test fixture
In the field of AI vision edge computing, the mainstrea…
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HBM3 MPGA Socket advantages in Hongyi Electronics Co.,LTD
For HBM3 high-bandwidth storage DRAM chips with MPGA pa…
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NPU IC test Socket from ANDK Socket
NPU (Neural Processing Unit) is a type of chip specific…
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QFN42-0.4 CMOS Image Processor Chip Test Socket with Lens Mounting Fixture
Product Features: Chip Testing: The QFN42-0.4 CMOS imag…
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Customized 21Pin-0.63 Fiber Module Test Socket
Product Introduction: 21Pin-0.63 Fiber Module Test Sock…
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TOLL package high-current chip test socket
The TOLL package high-current chip test socket is speci…
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WLCSP6-0.4 LDO Regulator Test socket function shown
The NCP139 is a 1 A VLDO equipped with an NMOS pass tra…
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Introduction to the Differential Crystal Oscillator Testing Fixture for High-definition Video Processors
Video processor devices are commonly used in high-defin…
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The usage of crystal oscillator testing fixtures in digital audio and the advantages
What is clock？ In digital audio, the phase noise of the…
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Programmable crystal oscillators Socket
Programmable crystal oscillators are mostly active crys…
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77Pin-1.5-45*50 IoT chip debugging socket and RF testing
For customizing an IoT chip test Socket with 77 pins, a…
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LCC48 ATE high UPH test socket for firmware programming
LCC48-1.0 is a type of chip package commonly used for i…
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TO252-3L Test Socket for high Current 50A
The TO252-3L is a type of package commonly used to acco…
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BGA144-1.27 Multi-Channel Regulated Power Supply Test Socket
The BGA144-1.27 Multi-Channel Regulated Power Supply Te…
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The QFN40-0.4-6*4 irregular chip test socket is used for Burn in tests
The QFN40-0.4-6*4 irregular chip test socket is a testi…
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TSSOP20-0.5 EEPROM chip test socket firmware programming and burn-in testing.
The TSSOP20 package is a surface mount package with 20 …
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LED dot matrix driver QFP52-0.65 test socket
LED dot matrix driver chip QFP52-0.65 chip test socket …
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BGA25-1.27 LTM Series Aging Test Socket: Unleash the Power of Reliability!
Are you tired of compromising on the quality and reliab…
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TO252-5L flip-chip Burn in socket with multiple pins for high voltage low current testing.
TO252-5 is a type of package, also known as DPAK-5 pack…
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BGA1268-0.8 optoelectronic module test socket is used for functional verification
The BGA1268-0.8 optoelectronic module test socket is us…
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Superconducting Optical Detector Chip Test Fixture
The Superconducting Optical Detector Chip Test Fixture …
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QFN80-0.4 burn in function Socket info
QFN80-0.4 Chip Test Socket is a specialized test socket…
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About crystal and oscillator different and its socket
Crystals and oscillators are commonly used clock source…
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Introduction to the key points of the high-frequency rectifier chip test fixture
High-frequency rectifier chip testing key points and co…
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The BGA641-0.4 test fixture is used for testing the functionality of mobile phone CPUs.
The BGA641-0.4 test fixture is a tool used for testing …
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What features should a 4-channel AM Mini LED backlight driver QFN24-0.5 test socket have?
A 4-channel AM Mini LED backlight driver QFN24-0.5 test…
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BGA25-1.27 Chip Test Socket for DC/DC Switch Converter Function Test
Product Name: BGA25-1.27 Chip Test Socket Package Size:…
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SIC test socket: What requirements are needed to meet the testing needs of the chip?
SIC (Silicon Carbide) chips refer to semiconductor chip…
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The 2023 Nobel Prize in Physics – Future Applications of Attosecond Optics in the Field of IC Technology
The 2023 Nobel Prize in Physics has been awarded to Pie…
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Photonic chip test socket and its corresponding advantages
Photon chips (PIC) are integrated circuit chips based o…
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Hall sensor chips Socket & Its requirement
Hall sensor chips are sensor chips based on the Hall ef…
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HBM and related test Socket requirements support
High-bandwidth memory（HBM） is a type of memory that has…
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SIC IC and GaN IC Test socket
SiC and GaN chips, representing Silicon Carbide and Gal…
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Enhancing Chip Performance with BGA24 Thermal Monitoring Test Socket
In today’s high-tech industry, chip performance a…
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RRAM IC and its BI socket and FT socket
RRAM chip is a type of non-volatile memory chip, which …
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CLCC84-0.8 socket for CMOS function test
The CLCC84-0.8 chip testing socket is a crucial technol…
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One Device Socket Customized
In the bustling Silicon Valley, there is an innovative …
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LGA8-1.27 SD NAND to USB fixture solution
SD NAND (Secure Digital NAND) is a specific type of NAN…
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What is HTRB Test and JEDEC Standard?
HTRB (High Temperature Reverse Bias) is a testing metho…
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What is HAST? Which reason help IC burn socket to work well in HAST?
HAST stands for Highly Accelerated Stress Test. It is a…
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why IC need to do burn in test?
ICs (integrated circuits) undergo burn-in testing to en…
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What is IC Burn in socket? What JEDEC standard for IC burn in test?
An IC burn-in socket is a specialized type of IC socket…
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What is IC Socket?
An IC socket, also known as an integrated circuit socke…
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BGA77-1.27 Package Chip Test Socket
The BGA77-1.27 package chip test socket is a highly spe…