分类: Uncategorized
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QFN42-0.4 CMOS Image Processor Chip Test Socket with Lens Mounting Fixture
Product Features: Chip Testing: The QFN42-0.4 CMOS imag…
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Customized 21Pin-0.63 Fiber Module Test Socket
Product Introduction: 21Pin-0.63 Fiber Module Test Sock…
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TOLL package high-current chip test socket
The TOLL package high-current chip test socket is speci…
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WLCSP6-0.4 LDO Regulator Test socket function shown
The NCP139 is a 1 A VLDO equipped with an NMOS pass tra…
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Introduction to the Differential Crystal Oscillator Testing Fixture for High-definition Video Processors
Video processor devices are commonly used in high-defin…
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The usage of crystal oscillator testing fixtures in digital audio and the advantages
In digital audio, the phase noise of the clock frequenc…
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Programmable crystal oscillators Socket
Programmable crystal oscillators are mostly active crys…
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77Pin-1.5-45*50 IoT chip debugging socket and RF testing
For customizing an IoT chip test Socket with 77 pins, a…
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LCC48 ATE high UPH test socket for firmware programming
LCC48-1.0 is a type of chip package commonly used for i…
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TO252-3L Test Socket for high Current 50A
The TO252-3L is a type of package commonly used to acco…
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BGA144-1.27 Multi-Channel Regulated Power Supply Test Socket
The BGA144-1.27 Multi-Channel Regulated Power Supply Te…
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The QFN40-0.4-6*4 irregular chip test socket is used for Burn in tests
The QFN40-0.4-6*4 irregular chip test socket is a testi…
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TSSOP20-0.5 EEPROM chip test socket firmware programming and burn-in testing.
The TSSOP20 package is a surface mount package with 20 …
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LED dot matrix driver QFP52-0.65 test socket
LED dot matrix driver chip QFP52-0.65 chip test socket …
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BGA25-1.27 LTM Series Aging Test Socket: Unleash the Power of Reliability!
Are you tired of compromising on the quality and reliab…
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TO252-5L flip-chip Burn in socket with multiple pins for high voltage low current testing.
TO252-5 is a type of package, also known as DPAK-5 pack…
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BGA1268-0.8 optoelectronic module test socket is used for functional verification
The BGA1268-0.8 optoelectronic module test socket is us…
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Superconducting Optical Detector Chip Test Fixture
The Superconducting Optical Detector Chip Test Fixture …
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QFN80-0.4 burn in function Socket info
QFN80-0.4 Chip Test Socket is a specialized test socket…
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About crystal and oscillator different and its socket
Crystals and oscillators are commonly used clock source…
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Introduction to the key points of the high-frequency rectifier chip test fixture
High-frequency rectifier chip testing key points and co…
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The BGA641-0.4 test fixture is used for testing the functionality of mobile phone CPUs.
The BGA641-0.4 test fixture is a tool used for testing …
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What features should a 4-channel AM Mini LED backlight driver QFN24-0.5 test socket have?
A 4-channel AM Mini LED backlight driver QFN24-0.5 test…
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BGA25-1.27 Chip Test Socket for DC/DC Switch Converter Function Testin
Product Name: BGA25-1.27 Chip Test Socket Package Size:…
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SIC test socket: What requirements are needed to meet the testing needs of the chip?
SIC (Silicon Carbide) chips refer to semiconductor chip…
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The 2023 Nobel Prize in Physics – Future Applications of Attosecond Optics in the Field of IC Technology
The 2023 Nobel Prize in Physics has been awarded to Pie…
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Photonic chip test socket and its corresponding advantages
Photon chips (PIC) are integrated circuit chips based o…
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Hall sensor chips Socket & Its requirement
Hall sensor chips are sensor chips based on the Hall ef…
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HBM and related test Socket requirements support
High-bandwidth memory(HBM) is a type of memory that has…
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SIC IC and GaN IC Test socket
SiC and GaN chips, representing Silicon Carbide and Gal…
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Enhancing Chip Performance with BGA24 Thermal Monitoring Test Socket
In today’s high-tech industry, chip performance a…
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RRAM IC and its BI socket and FT socket
RRAM chip is a type of non-volatile memory chip, which …
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CLCC84-0.8 socket for CMOS function test
The CLCC84-0.8 chip testing socket is a crucial technol…
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One Device Socket Customized
In the bustling Silicon Valley, there is an innovative …
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LGA8-1.27 SD NAND to USB fixture solution
SD NAND (Secure Digital NAND) is a specific type of NAN…
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What is HTRB Test and JEDEC Standard?
HTRB (High Temperature Reverse Bias) is a testing metho…
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What is HAST? Which reason help IC burn socket to work well in HAST?
HAST stands for Highly Accelerated Stress Test. It is a…
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why IC need to do burn in test?
ICs (integrated circuits) undergo burn-in testing to en…
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What is IC Burn in socket? What JEDEC standard for IC burn in test?
An IC burn-in socket is a specialized type of IC socket…
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What is IC Socket?
An IC socket, also known as an integrated circuit socke…
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BGA77-1.27 Package Chip Test Socket
The BGA77-1.27 package chip test socket is a highly spe…