What is HTRB Test and JEDEC Standard?

HTRB (High Temperature Reverse Bias) is a testing method used to evaluate the reliability of chips. It is primarily applied in the reliability assessment of devices such as Silicon Controlled Rectifiers (SCRs), diodes, and transistors.

In the HTRB test, the chip is subjected to a high-temperature environment while applying a reverse bias voltage. The purpose of this testing method is to simulate the chip’s operation under high temperature and reverse voltage conditions to assess its reliability in such stress environments.

The HTRB test helps detect and evaluate the performance and reliability of the chip under high temperature and reverse voltage conditions. It is commonly used to assess the chip’s withstand voltage capability, reverse leakage current, reverse breakdown voltage, and the impact of temperature on chip performance.

It is important to note that the HTRB test is primarily applicable to specific types of chips, such as SCRs, diodes, and transistors. Different testing methods may be used to evaluate the reliability and performance of other types of chips.

The HTRB (High Temperature Reverse Bias) test is a widely recognized reliability test for semiconductor devices, and it is standardized by JEDEC (Joint Electron Device Engineering Council). JEDEC is an organization that develops and publishes standards for the microelectronics industry.

The specific JEDEC standard that governs the HTRB test is JEDEC JESD22-A108. This standard outlines the test procedure, conditions, and requirements for conducting the HTRB test on semiconductor devices. It provides guidelines on the test setup, test duration, temperature range, bias conditions, and measurement parameters.

JEDEC JESD22-A108 specifies the test conditions for HTRB testing, including the temperature range, duration of the test, and the application of reverse bias voltage. It also provides guidelines for data collection and analysis, as well as reporting the results of the HTRB test.

By following the HTRB test procedures outlined in the JEDEC JESD22-A108 standard, semiconductor manufacturers can ensure consistency and comparability in their reliability testing processes. Adhering to this standard helps ensure that the HTRB test results are reliable, accurate, and consistent across different devices and manufacturers.