Photonic chip test socket and its corresponding advantages

Photon chips (PIC) are integrated circuit chips based on the principles of photonics, using photons to transmit and process information. Compared to traditional electronic chips, photon chips offer higher transmission speeds, lower power consumption, and larger bandwidth.

The test socket for photon chips needs to have the following capabilities to meet the testing requirements of photon chips:

1. The test socket should match the size and spacing of the photon chip. Additionally, special attention should be given to the fact that some photon chips may have external light sources, such as optical modules. Therefore, the test socket production should consider requirements such as avoiding obstructions.
2. High-speed transmission capability: The test socket for photon chips needs to support high-speed optical signal transmission to meet the high-speed data transmission requirements of photon chips.
3. Low insertion loss: The design of the test socket should minimize the insertion loss of the optical signal during testing to ensure the accuracy of test results.
4. Low reflection loss: The test socket should have low reflection loss characteristics to avoid interference from signal reflections on test results.
5. Multiple channel support: Photon chips often have multiple channels, so the test socket needs to support multi-channel testing to accurately evaluate the performance of each channel.
6. High stability: The test socket needs to have high stability to maintain consistent performance during long-term operation.
7. High precision calibration: The test socket for photon chips needs to have high precision calibration capability to ensure the accuracy of test results.
8. Low noise: The test socket should have low noise characteristics to avoid interference from noise on the test results of photon chips.

In summary, the test socket for photon chips needs to have high-speed transmission capability, low insertion loss, low reflection loss, multi-channel support, high stability, high precision calibration, and low noise characteristics to meet the testing requirements of photon chips.