Details of Automotive Semiconductor Device Testing Standards

1. AEC-Q100

The AEC-Q100 standard focuses on evaluating the long-term reliability of semiconductor devices, particularly for automotive applications. The specific tests include:

• High-Temperature Storage Test (HTS): Storing the device at high temperatures (e.g., 150°C) for a specified duration (e.g., 1000 hours) to assess thermal stability.
• High-Temperature Operating Life Test (HTOL): Operating the device at high temperatures (e.g., 125°C) for an extended period (e.g., 1000 hours) to simulate performance changes during long-term use.
• Temperature Cycle Test (TCT): Subjecting the device to extreme temperature cycles (e.g., -40°C to +125°C) to evaluate its thermal stress tolerance.
• Humidity Test (HAST): Accelerated aging under high temperature and high humidity conditions (e.g., 85°C, 85% RH) to test the device’s resistance to moisture.
• Mechanical Stress Tests: Includes vibration, shock, and other physical stress tests to assess the device’s durability in real-world conditions.

2. ISO 26262

ISO 26262 is a standard for automotive functional safety, with specific details including:

• Safety Lifecycle: Covers the entire product lifecycle from concept, development, and production to operation and maintenance, including safety management.
• Functional Safety Concept: Defines safety requirements for system functions and identifies potential hazards and risks.
• Safety Analysis: Includes Failure Mode and Effects Analysis (FMEA) and Fault Tree Analysis (FTA) to assess system reliability and safety.
• Hardware and Software Safety Verification: Detailed verification and validation of hardware and software to ensure safety under various fault conditions.
• Safety Requirements and Testing: Development and execution of test plans to ensure that systems meet functional safety requirements.

3. ISO/TS 16949 (now IATF 16949)

This standard relates to quality management systems with specific details including:

• Quality Management System Requirements: Includes process control, product inspection, corrective actions, and preventive measures.
• Continuous Improvement: Requires companies to continuously improve their quality management systems to enhance product quality and process efficiency.
• Supply Chain Management: Ensures that suppliers’ quality management systems meet standards to guarantee the quality of materials and components.
• Customer Satisfaction: Regular review and feedback from customers to continuously improve the quality management system and meet customer needs.

4. JESD22

JESD22 is a standard for environmental testing of semiconductor devices, with specific details including:

• Thermal Cycling Test (JESD22-A104): Cycling the device through extreme temperature changes (e.g., -55°C to +125°C) to check reliability under thermal stress.
• High-Acceleration Life Test (JESD22-A108): Accelerated aging of the device under high temperature and high voltage to test its lifespan.
• Humidity-Accelerated Life Test (HAST) (JESD22-A110): Accelerated aging in high temperature and high humidity conditions to evaluate moisture resistance.
• Mechanical Stress Tests (JESD22-B103): Includes vibration and shock tests to assess the mechanical durability of the device.