HTGB +/- Positive For TO220/TO247 type IGTB Burn in Test

HTGB (High-Temperature Gate Bias) testing is a method used to evaluate the reliability and stability of semiconductor devices, particularly power devices and insulated-gate bipolar transistors (IGBTs), under high-temperature conditions. The primary purpose of HTGB testing is to accelerate the aging process of the device, allowing for the assessment of its long-term performance and reliability in a shorter period.

In HTGB testing, a constant gate bias voltage is applied to the device in a high-temperature environment. The specific conditions of the test, such as temperature, bias voltage, and duration, vary depending on the type of device and its application.

Standards involved in HTGB testing may include:

• JEDEC Standards: Such as JESD22-A108, which is specifically for accelerated life testing.
• MIL-STD-750: Test methods for military semiconductor devices.
• IEC Standards: Relevant standards from the International Electrotechnical Commission.

During HTGB testing, both positive bias and negative bias aging test boards are typically used:

• Positive Bias Testing: In this test, a positive voltage is applied to the gate. This test is usually used to evaluate the stability and leakage current characteristics of the device under positive gate voltage.
• Negative Bias Testing: In this test, a negative voltage is applied to the gate. This test is used to evaluate the performance of the device under negative gate voltage, as negative bias may trigger different aging mechanisms in certain types of devices.

TO-220 and TO-247 are two common types of power semiconductor packages, widely used in various power electronic devices such as MOSFETs, IGBTs, and diodes. Using HTGB testing on chips with these package types primarily aims to assess their long-term reliability and performance stability under high-temperature and bias voltage conditions.

Purposes of HTGB Testing

1. Reliability Assessment: Accelerated aging tests can predict the lifespan and reliability of devices in actual applications.
2. Quality Control: Ensures that produced devices meet quality standards, reducing the risk of early failures.
3. Performance Verification: Verifies the stability of device performance under high-temperature and bias voltage conditions, ensuring normal operation under extreme conditions.
4. Failure Analysis: Identifies potential failure mechanisms through test results, providing a basis for improving design and manufacturing processes.

Test Duration

The duration of HTGB testing typically depends on specific test standards and the application requirements of the device. Generally, the test duration can range from several hundred hours to several thousand hours. Common test durations include:

• 168 hours (7 days)
• 500 hours
• 1000 hours
• 2000 hours

The specific test duration should be determined based on the application environment and reliability requirements of the device.

Integration with Automated Testing

To improve testing efficiency and accuracy, HTGB testing is usually integrated with automated testing systems. Automated testing systems can achieve the following functions:

1. Temperature Control: Precisely control the test environment temperature, ensuring consistent test conditions.
2. Voltage Application: Automatically apply and monitor gate bias voltage, ensuring voltage stability.
3. Data Acquisition: Real-time acquisition and recording of electrical parameters of the device, such as leakage current and gate current.
4. Fault Detection: Automatically detect and record device failures, promptly terminating the test for failed devices.
5. Report Generation: Automatically generate test reports for analysis and record-keeping.

Components of an Automated Testing System

1. Temperature Chamber: Provides a stable high-temperature environment.
2. Power Supply: Applies gate bias voltage.
3. Data Acquisition System: Monitors and records test data in real-time.
4. Control Software: Sets test parameters, monitors the test process, and generates test reports.

By using automated testing systems, the efficiency and accuracy of HTGB testing can be significantly improved, reducing errors and uncertainties caused by manual operations, and thus more reliably assessing the long-term performance and reliability of devices.