HDSOP22-1.14 Burn in Socket For AEC-Q101 test

Product Overview:

The HDSOP22-1.14 Aging Socket is specifically designed for Burn in verification of 600V CoolMOS power transistor chips, compliant with automotive-grade AEC-Q101 standards. It employs advanced technology and design to ensure high reliability and stability, serving as an indispensable tool in the development and production processes of electronic products.

Key Features:

  1. Compatibility and Applicability: The HDSOP22-1.14 Aging Socket is tailored for 600V CoolMOS power transistor chips, meeting the stringent requirements of high-voltage applications. It supports automotive-grade AEC-Q101 standards, suitable for automotive electronics and industrial power applications.
  2. Burn in Verification: As an aging verification device, the HDSOP22-1.14 provides a reliable testing environment to ensure the stability and reliability of products under prolonged operation and high-temperature conditions. This is crucial for assessing the lifespan and performance of chips.
  3. Design Advantages: The device design prioritizes safety and stability in high-temperature and high-voltage environments, ensuring precision and repeatability during testing.
  4. Wide Applications: Suitable for various stages of electronic product development and production, particularly critical for automotive electronic systems and industrial power supplies.

Technical Specifications:

  • Chip Compatibility: 600V CoolMOS power transistor chips
  • Standards Compliance: Compliant with AEC-Q101 automotive-grade standards
  • Temperature Range: High-temperature resistant to ensure testing stability
  • Safety: Designed for safety and stability in high-voltage environments
  • Testing Reliability: Provides reliable aging verification testing environment for accurate product performance and lifespan assessment

Applications:

  • Automotive electronic systems
  • Industrial power applications
  • Other high-voltage application fields

Summary:

The HDSOP22-1.14 Aging Socket is a specialized device designed to meet the testing needs under high-voltage and high-temperature environments, particularly suited for automotive electronics and industrial power applications. It complies with AEC-Q101 standards, offering reliable aging verification to ensure product quality and performance stability.


已发布

分类

来自

标签:

评论

发表回复

您的邮箱地址不会被公开。 必填项已用 * 标注